Metrology Equipment
TFE-ID
Manufacturer/Model
Details
tfe130
Intellemetrix - IL900 - Deposition Rate Measurement
view
tfe028
Gaertner - L-116 - Ellipsometer
tfe282
Nanometrics - Nanospec 9000i - Integrated Film Analysis Sys
view
tfe416
KLA Tencor - HRP220 - Inspection System
view
tfe422
Magnetron - M-800 - Four-Point Probe
view
tfe449
KLA Tencor - 2135 - Wafer Defect Inspection System
view
tfe459
OSI - 2100 - Overlay and CD Measurement System
view
tfe484
IVS - 200 - Wafer Inspection System
view
tfe498
Nanometrics - 181 - Film Thickness Measurement System
view
tfe512
IADE - 9700 - Wafer Dimensional Measurement System
view
tfe515
Applied Materials - Vision CX - SEM
view
tfe516
Applied Materials - Opal 7830i - CD SEM
view
tfe526
Applied Materials - Opal 7830i - CD SEM
view
tfe538
ADE - 780 MRT - Digital Measurement System
view
tfe541
KLA Tencor - eS20XP - E-Beam Wafer Inspection System
view
tfe548
Thermawave - Optiprobe 2600 - Probe
view
tfe550
Applied Materials - Vision - SEM
view
tfe553
Prometrix - FT-600 - Film Thickness Measurement System
view
tfe554
Prometrix - FT-700 - Film Thickness Measurement System
view
If the equipment you require is not listed, please send a request
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